| 摘要 |
A light-receiving element has a photodiode formed in part of the top surface of a semiconductor substrate so as to function as a light-receiving region, and has a light-emitting element mount electrode formed on top of the semiconductor substrate where the light-receiving region is not formed. A high concentration impurity layer is formed below the top surface of the semiconductor substrate along the peripheral edges of the light-emitting element mount electrode. This helps prevent the voltage applied to the light-emitting element mount electrode from influencing the output of the light-receiving element. Alternatively, a photonic semiconductor device has a light-emitting element and a light-receiving element, and has the light-receiving region of the light-receiving element formed parallel to the direction in which the light-emitting element emits light. The light-emitting element is arranged so that, when viewed in a plan view, the light-emitting point thereof overlaps with at least part of the light-receiving region. This permits easy fitting of the light-emitting element even with a low light-emitting point, and thus helps reduce variation in light reception sensitivity. <IMAGE> |
