| 摘要 |
<p>A testing device comprises a plurality of testing signal feeding units corresponding to individual test memories, for feeding the corresponding individual test memories with testing signals to test the test memories, a plurality of fault detecting units corresponding to the individual test memories, for detecting the faults of the test memories, a plurality of first analyzing units corresponding to the individual test memories, for replacing a faulty memory cell in the corresponding test memory by any preparatory cell owned by that test memory thereby to determine a relieving solution to relieve the fault of that test memory, and a second analyzing unit for succeeding, in response to the start of the analysis of the relief solution on the different test memories by the first analyzing units, the analyzing operation of that relief solution from the first analyzing unit not having finished the analysis of the relief solution, thereby to determine that relief solution.</p> |
