发明名称 Apparatus and method for patterning
摘要 <p>A pattern forming apparatus and a method are provided to perform quickly a photoresist pattern forming process and to improve productivity by removing selectively a photoresist layer from a substrate at one time using predetermined plasma. A pattern forming apparatus includes a first electrode, a second electrode, a power source, a gas nozzle, and pattern through holes. The first electrode(20) includes a first dielectric film. The first electrode is grounded. The second electrode(24) is spaced apart from the first electrode. The second electrode includes a second dielectric film. The power source(28) is used for forming an electric field between the first and second electrodes. The gas nozzle(30) is used for supplying a predetermined gas into a predetermined space between the first and second electrodes. The pattern through holes(34) are formed in the second dielectric film of the second electrode in order to apply selectively a predetermined plasma onto a photoresist layer of a substrate, wherein the predetermined plasma is obtained from the predetermined gas under the electric field condition.</p>
申请公布号 KR20070032600(A) 申请公布日期 2007.03.22
申请号 KR20050086985 申请日期 2005.09.16
申请人 发明人
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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