发明名称 MAGNETORESISTANCE EFFECT ELEMENT, TMR ELEMENT, AND METHOD OF MANUFACTURING
摘要 PROBLEM TO BE SOLVED: To provide a TMR element or the like capable of performing high-temperature annealing treatment. SOLUTION: A TMR element 51 is provided with a TMR film 53 including an antiferromagnetic layer 61, a pinned layer 63, a barrier layer 65, and a free layer 67; and a lower magnetic shield film 55 provided at the lower part in the laminating direction of the TMR film. The barrier layer comprises a magnesium oxide, and the lower magnetic shield film has a multilayer structure including a crystalline layer 71 and an amorphous layer 73 provided at the upper part in its laminating direction. The crystalline layer contains at least one crystal grain having a grain diameter of 500 nm or more. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007073944(A) 申请公布日期 2007.03.22
申请号 JP20060216715 申请日期 2006.08.09
申请人 TDK CORP 发明人 KAGAMI TAKERO;OTA NAOKI;SATO KAZUKI;MIURA SATOSHI
分类号 H01L43/08;G01R33/09;G11B5/39;H01L21/8246;H01L27/105;H01L43/10;H01L43/12 主分类号 H01L43/08
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