发明名称 X-RAY ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide an X-ray analyzer capable of irradiating a sample with X rays of low intensity. SOLUTION: In a case that the intensity of primary X rays used for irradiating the sample 4 is too intensive, a mesh 7 is arranged between an X-ray tube 5 and the sample 4. The primary X rays 15 from the X-ray tube 5 are absorbed by the mesh 7 to be cut off. That is, since the gold 7c of the mesh 7 is a material with a high absorption coefficient of X rays over the whole wavelength region, the primary X rays 15 are absorbed by the gold 7c to be cut off. The sample 4 is irradiated with the primary X rays 15' passed through the openings 7d of the mesh 7. As a result, the primary X rays from the X-ray tube 5 are reduced in its intensity by the mesh 7 to irradiate the sample 4. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007071697(A) 申请公布日期 2007.03.22
申请号 JP20050259034 申请日期 2005.09.07
申请人 JEOL LTD 发明人 KINUGASA MOTOKI
分类号 G01N23/223 主分类号 G01N23/223
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