| 摘要 |
PROBLEM TO BE SOLVED: To detect a longitudinal linear defect caused by charge leakage at the time of transfer from a vertical transfer section to a horizontal transfer section. SOLUTION: In a solid-state imaging apparatus comprising a vertical transfer register for vertically transferring electric charge obtained by a photoelectric converting element, a horizontal transfer register for horizontally transferring the electric charge transferred from the vertical transfer register, a horizontal transfer output gate, an FD for converting the charge into a voltage and a driving signal generating section, the driving signal generating section gives the horizontal transfer register two phases of horizontal transfer pulses Hϕ1, Hϕ2 that invert in the same timing, and sets a potential L of a low level low stepwise or gradually while holding constant a potential difference V<SB>H</SB>between a high level and the low level of the horizontal transfer pulse during a term of horizontal transfer due to the horizontal transfer register. COPYRIGHT: (C)2007,JPO&INPIT
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