发明名称 SAMPLING DEVICE AND TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a sampling device which samples a signal to be measured at a high frequency. SOLUTION: The sampling device is equipped with a pulse-generating circuit and a sampling circuit; the pulse generating circuit has a step-recovery diode and an anode-side input terminal and a cathode-side input terminal of the diode; the sampling circuit has a measured signal wire for inputting the signal to be measured, anode-side and cathode-side first wires of the step recovery diode which propagate a pulse signal generated by the pulse-generating circuit; and a sampling part, including a first diode for sampling which has its anode connected to the cathode-side first wire side and its cathode, connected to the measured signal wire and a second diode for sampling, which has its anode connected to the measured signal wire and its cathode connected to the anode-side first wire side, wherein the step recovery diode and diodes for sampling are formed in different semiconductor layers. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007074132(A) 申请公布日期 2007.03.22
申请号 JP20050256736 申请日期 2005.09.05
申请人 ADVANTEST CORP 发明人 SATO SEIYA;KONNO TAKESHI;SHIBA SEISHI;MIYAMOTO HIROSHI
分类号 H03K3/313;G01R31/319;H03K17/00 主分类号 H03K3/313
代理机构 代理人
主权项
地址