| 摘要 |
PROBLEM TO BE SOLVED: To measure the electrical characteristics of a chip-shaped circuit part by correcting a retention position in the carrier of the chip-shaped circuit part and positively bringing a contact terminal into contact with an electrode even if the length of the chip-shaped circuit part scatters slightly. SOLUTION: A measuring device of a chip-shaped circuit part has a carrier 11 for carrying a chip-shaped circuit part 14 at a specific gap, contact terminals 17 and 17 in contact with electrodes 15 and 15 at both terminals of the chip- shaped circuit part 14 being carried to the carrier 11, and a measuring instrument 18 that is connected to the connection terminals 17 and 17 and measures the electrical characteristics of the chip-shaped circuit part 14 between the electrodes 15 and 15 of the chip-shaped circuit part 14 that conducts through the contact terminals 17 and 17. The carrier 11 has a retention groove 13 where the chip-shaped circuit part 14 is retained in the longer direction so that it can travel freely and has a position correction mechanism for correcting the position deviation in a longer direction for the contact terminals 17 and 17 of the chip-shaped circuit part 14 at a position or near the position where the contact terminals 17 and 17 contact the electrodes 15 and 15 of the chip-shaped circuit part 14. |
