发明名称 TESTER AND TEST METHOD
摘要 PROBLEM TO BE SOLVED: To efficiently measure the amount of variation in a power source voltage accompanying a change in electric current consumption in a device under test. SOLUTION: This tester for testing variation in the power source voltage supplied to the device under test is equipped with: a power source part for supplying the power source voltage to a power source input terminal of the device; an oscillator for outputting a clock signal of a frequency corresponding to the source voltage supplied to the input terminal of the device; and a measurement part for measuring the frequency of the clock signal. For example, the oscillator outputs, as the clock signal, an output signal of any NOT logical element out of an odd number of NOT logical elements together connected like a loop. The logical element operates with a voltage corresponding to the source voltage used as a voltage source, the source voltage supplied to the input terminal of the device. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007071622(A) 申请公布日期 2007.03.22
申请号 JP20050257435 申请日期 2005.09.06
申请人 ADVANTEST CORP 发明人 TANAKA KOICHI;SUDA MASAKATSU
分类号 G01R31/319;G01R19/252 主分类号 G01R31/319
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