发明名称 |
EXPOSURE DOSE ABNORMALITY ANALYSIS DEVICE AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To allow a user to recognize a cause of an increase in an exposure dose. SOLUTION: This exposure dose abnormality analysis device is so formed that a processor 11 comparatively analyzes the relationship of a plurality of parameters related to the exposure dose of radiation in a single examination for a plurality of examinations. The processor 11 specifies the cause of the abnormality of the examination wherein the exposure dose is abnormal based on the comparative analysis result. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007068720(A) |
申请公布日期 |
2007.03.22 |
申请号 |
JP20050258053 |
申请日期 |
2005.09.06 |
申请人 |
TOSHIBA CORP;TOSHIBA MEDICAL SYSTEMS CORP |
发明人 |
OWAKI NAOKI;TAKADA YOICHI;IKEDA SATOSHI;YAGI MINORU |
分类号 |
A61B6/03 |
主分类号 |
A61B6/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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