发明名称 EXPOSURE DOSE ABNORMALITY ANALYSIS DEVICE AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To allow a user to recognize a cause of an increase in an exposure dose. SOLUTION: This exposure dose abnormality analysis device is so formed that a processor 11 comparatively analyzes the relationship of a plurality of parameters related to the exposure dose of radiation in a single examination for a plurality of examinations. The processor 11 specifies the cause of the abnormality of the examination wherein the exposure dose is abnormal based on the comparative analysis result. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007068720(A) 申请公布日期 2007.03.22
申请号 JP20050258053 申请日期 2005.09.06
申请人 TOSHIBA CORP;TOSHIBA MEDICAL SYSTEMS CORP 发明人 OWAKI NAOKI;TAKADA YOICHI;IKEDA SATOSHI;YAGI MINORU
分类号 A61B6/03 主分类号 A61B6/03
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