| 摘要 |
PROBLEM TO BE SOLVED: To miniaturize and weight-reduce surface plasmon resonance measuring device having a highly-integrated/parallel detection mechanism. SOLUTION: In this surface plasmon resonance angle spectrum measuring device, a material onto the metal surface is detected by surface plasmon polariton resonance. The device is characterized by having an angle measuring mechanism 4 for measuring a resonance coupling angle from the locus of a beam in an imaged image by combining a two-dimensional plane waveguide 6 comprising one or more layers of metal films and one or more layers of dielectric films with an imager. COPYRIGHT: (C)2007,JPO&INPIT
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