发明名称 |
Method and apparatus for testing an integrated device's input/output (I/O) |
摘要 |
A plurality of timing diagrams and different versions of circuits to test an integrated device in a test mode of operation. The invention allows for pulling in a strobe and eliminating the need for delay cells in strobe pads and a clock generation that facilitates varying the duty cycle for pulling in the strobe and pushing out the data.
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申请公布号 |
US2007067686(A1) |
申请公布日期 |
2007.03.22 |
申请号 |
US20030659957 |
申请日期 |
2003.09.10 |
申请人 |
KHONDKER TANVEER R;NAZARETH MATTHEW B;VUPPALADADIUM VIJAY K |
发明人 |
KHONDKER TANVEER R.;NAZARETH MATTHEW B.;VUPPALADADIUM VIJAY K. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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