| 摘要 |
A method, a laboratory device and the use of both for simulating the dynamic temperature behavior of at least one part of a process plant, particularly an industrial reactor, using a laboratory device, the method characterized in that a temperature profile is and/or temperature setpoints are provided at given time intervals for controlling the laboratory device, wherein the temperature profile and/or the temperature setpoints are derived from a mathematical model, said mathematical model describing the dynamic temperature behavior of at least one part of said process plant, and wherein said temperature profile and/or said temperature setpoints are used by a program for controlling the laboratory device.
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