发明名称 LITHOGRAPHY PROCESS OPTIMIZATION AND SYSTEM
摘要 The first and second example embodiments are Pattern Fidelity Optimization Procedures for a Multiple Exposure Scheme. In the third example embodiment, the aperatures from the multiple exposure system can be combined into a single aperture by adding the apertures and modulating the relative transmission thru the respective apertures to match the prescribed dose split determined in above in the first embodiment.
申请公布号 SG130090(A1) 申请公布日期 2007.03.20
申请号 SG20060044630 申请日期 2006.07.03
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CROUSE MICHAEL MATTHEW;YUDHISTIRA YASRI
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