发明名称 Forming dual metal complementary metal oxide semiconductor integrated circuits
摘要 Complementary metal oxide semiconductor metal gate transistors may be formed by depositing a metal layer in trenches formerly inhabited by patterned gate structures. The patterned gate structures may have been formed of polysilicon in one embodiment. The trenches may be filled with metal by surface activating using a catalytic metal, followed by electroless deposition of a seed layer followed by superconformal filling bottom up.
申请公布号 US7192856(B2) 申请公布日期 2007.03.20
申请号 US20050037860 申请日期 2005.01.18
申请人 INTEL CORPORATION 发明人 DOCZY MARK;WONG LAWRENCE D.;DUBIN VALERY M.;BRASK JUSTIN K.;KAVALIEROS JACK;DATTA SUMAN;METZ MATTHEW V.;CHAU ROBERT S.
分类号 H01L21/3205;H01L21/4763 主分类号 H01L21/3205
代理机构 代理人
主权项
地址