发明名称 Radiation tolerant SRAM bit
摘要 In an integrated circuit, a radiation tolerant static random access memory device comprising a first inverter having an input and an output, a second inverter having an input and an output. A first resistor is coupled between the output of the first inverter and the input of the second inverter. A second resistor is coupled between the output of the second inverter and the input of the first inverter. A first write transistor is coupled to the output of the first inverter and has a gate coupled to a source of a first set of write-control signals and a second write transistor is coupled to the output of the second inverter and has a gate coupled to said source of a second set of write-control signals. Finally, a pass transistor has a gate coupled to the output of on of the first and second inverters.
申请公布号 US7193885(B2) 申请公布日期 2007.03.20
申请号 US20040752222 申请日期 2004.01.05
申请人 发明人
分类号 G11C11/00;G06F11/00;G11C5/00;G11C11/412 主分类号 G11C11/00
代理机构 代理人
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