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发明名称
氮化物半导体基板及氮化物半导体基板之加工方法
摘要
于本发明之氮化物半导体基板之加工方法中,首先,准备圆盘状氮化物半导体基板(20),其具备复数个条状区域(12),该复数个条状区域(12)包含晶体缺陷密度高于周围之单晶体区域(14)之缺陷集中区域。继而,以条状区域(12)延伸之方向(ST)为基准,于氮化物半导体基板(20)之边缘之特定位置形成定向平面(OF)。
申请公布号
TW200710295
申请公布日期
2007.03.16
申请号
TW095130022
申请日期
2006.08.16
申请人
住友电气工业股份有限公司
发明人
西浦隆幸;目崎义雄
分类号
C30B29/38(2006.01);H01L21/304(2006.01)
主分类号
C30B29/38(2006.01)
代理机构
代理人
陈长文
主权项
地址
日本
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