| 摘要 |
The apparatus (1) for checking the operational condition of an electronic sensor element (3) which measures a physical quantity comprises testing means for providing a test deflection, corresponding to a specific change in the measured physical quantity, in the measurement signal produced by the sensor element and by a measuring circuit (2) connected thereto. According to the invention, the testing means comprise a testing circuit (4) which is galvanically separated from the measuring circuit and includes a light source (5a, 5b), and a light-sensitive component (6a, 6b) connected to the measuring circuit for receiving a light signal (7a, 7b) emitted by the light source and for further providing in the measurement signal a test deflection proportional to the light signal. |
