| 摘要 |
A microscope objective system is provided, comprising an objective ( 3 ), which comprises an illumination beam path via which illumination radiation from a source ( 2 ) is directed onto an object ( 7 ) to be examined, as well as a partial detection beam path surrounding at least part of the illumination beam path and, together with the illumination beam path, forms a detection beam path via which radiation to be detected and coming from the sample ( 7 ) is guided towards a detector ( 6 ).
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