| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device that can optimally control substrate bias. SOLUTION: To optimize substrate bias value, a temperature monitor circuit 503 is provided within a circuit block 502 within an LSI 501. The optimal value of the substrate bias of the temperature monitor circuit 503 largely depends on the temperature. Therefore, the temperature is monitored and the substrate bias depending on the temperature is applied. In addition to the temperature being monitored, a direct leak current is monitored and the substrate bias is applied in which the leak current becomes minimal. The semiconductor element (power source) is used that is optimal for the monitor circuits. The power source can be easily generated within a small area. COPYRIGHT: (C)2007,JPO&INPIT
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