WAVELENGTH DIVISION IMAGE MEASURING DEVICE

摘要

A wavelength division image measuring device for dividing wideband incident light from a measurement object into a plurality of wavelengths with high selectivity and measuring these images simultaneously and collectively. Micro periodic irregular lattice is formed on a substrate (302). A plurality of micro element regions (101) having different lattice shapes or lattice periods are arranged repeatedly in the plane of the substrate (302). A high refractive index material and a low refractive index material are laid alternately in multiple layers by bias sputtering to form a wavelength filter (301) of photonic crystal structure, thus obtaining an array of photonic crystal wavelength filter (031) having sharp wavelength selection characteristics and different wavelength transmission characteristics. That array is combined with an array of light receiving elements (302) having pixels (303) arranged oppositely to the element regions (101), thus obtaining the wavelength division image measuring device.