发明名称 |
RESIST COMPOSITION AND METHOD OF RESIST PATTERN FORMATION |
摘要 |
<p>A resist composition and method of resist pattern formation, by which a resist pattern can be formed with good mask reproducibility. There is provided a resist composition comprising (A) resist component whose alkali solubility is changed by acid action and (B) acid generator component capable of acid generation when exposed to light, wherein the acid generator component (B) contains an onium salt (B0) having an anion moiety of the general formula: R<SUP>o</SUP>SO<SUB>3</SUB></p> |
申请公布号 |
WO2007029701(A1) |
申请公布日期 |
2007.03.15 |
申请号 |
WO2006JP317555 |
申请日期 |
2006.09.05 |
申请人 |
TOKYO OHKA KOGYO CO., LTD.;SHIMIZU, HIROAKI;UTSUMI, YOSHIYUKI |
发明人 |
SHIMIZU, HIROAKI;UTSUMI, YOSHIYUKI |
分类号 |
G03F7/004;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|