发明名称 RESIST COMPOSITION AND METHOD OF RESIST PATTERN FORMATION
摘要 <p>A resist composition and method of resist pattern formation, by which a resist pattern can be formed with good mask reproducibility. There is provided a resist composition comprising (A) resist component whose alkali solubility is changed by acid action and (B) acid generator component capable of acid generation when exposed to light, wherein the acid generator component (B) contains an onium salt (B0) having an anion moiety of the general formula: R&lt;SUP&gt;o&lt;/SUP&gt;SO&lt;SUB&gt;3&lt;/SUB&gt;</p>
申请公布号 WO2007029701(A1) 申请公布日期 2007.03.15
申请号 WO2006JP317555 申请日期 2006.09.05
申请人 TOKYO OHKA KOGYO CO., LTD.;SHIMIZU, HIROAKI;UTSUMI, YOSHIYUKI 发明人 SHIMIZU, HIROAKI;UTSUMI, YOSHIYUKI
分类号 G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/004
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