发明名称 WAFER TEMPERATURE ADJUSTMENT EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To keep the distance securely small between a wafer and a plane, while avoiding contact with the wafer and the plane set at a predetermined temperature. SOLUTION: A blowing outlet 3a and a suction inlet 3b are formed in a plane 3c. The blowing outlet 3a has a pipe of radius Ra and length La which are exposed to a plane 3c. The suction inlet 3b has a pipe of radius Rb and length Lb exposed to the plane 3c. Here, a shape parameter Ra<SP>4</SP>/La of the blowing outlet 3a is smaller than a shape parameter Rb<SP>4</SP>/Lb of the suction inlet 3b. Under the conditions of this relation, the differential pressure in the suction inlet 3b is made smaller than the differential pressure in the blowing outlet 3a. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007067070(A) 申请公布日期 2007.03.15
申请号 JP20050249451 申请日期 2005.08.30
申请人 DAIKIN IND LTD 发明人 TERAKI JIYUNICHI;HARADA KOICHI;TANAKA MITSUHIRO
分类号 H01L21/027;H01L21/683 主分类号 H01L21/027
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