| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection method for a semiconductor device wirelessly receiving a test program. <P>SOLUTION: As the inspection method of the semiconductor device, a test program is transmitted as a communication signal for every test. By transmitting a test program as a communication signal wirelessly at an operation test, test contents are changed as required. As a result, a test program can be easily changed and an inspection circuit or the like is not required. In this manner, manufacturing cost of a wireless chip can be reduced. <P>COPYRIGHT: (C)2007,JPO&INPIT |
