发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD FOR TESTING THE SAME
摘要 PROBLEM TO BE SOLVED: To find out a fuse element which is cut halfway. SOLUTION: A control signal CNT is turned into a high level and an NMOS transistor Q0 is turned on. Since a resistance value of a resistor R0 is a predetermined value at manufacturing a semiconductor integrated circuit device beforehand, a current I0 flowing through a measuring terminal P0 is measured by an external tester or the like, thereby determining a resistance value of a fuse element F0. If the resistance value (r) of the fuse element F0 is a certain value r1 or larger, for example, it is determined that the fuse element F0 is cut. If the resistance value (r) is a certain value r2 or smaller, it is determined that the fuse element is not cut. In the case of r2<r<r1, it is determined that the fuse element is cut incompletely. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007067340(A) 申请公布日期 2007.03.15
申请号 JP20050255043 申请日期 2005.09.02
申请人 NEC ELECTRONICS CORP 发明人 SUGANO KIYOSHI
分类号 H01L21/822;G01R31/02;G01R31/28;H01L27/04 主分类号 H01L21/822
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