| 摘要 |
PROBLEM TO BE SOLVED: To provide a test method for data storage device and a method for manufacturing a data storage device, in which a plurality of data storage devices can be simultaneously connected to a testing device to shorten the test time in operation test thereof. SOLUTION: When a plurality of HDDs 8<SB>1</SB>-8<SB>4</SB>connected to the testing device 1 receive and execute commands from the testing device 1, whereby the respective operation tests are performed, the testing device 1 executes operation test to another HDD in a waiting time where data exchange between the testing device 1 and, for example, the data storage device HDD8<SB>1</SB>is rested during execution of the operation test between the testing device 1 and the data storage device HDD8<SB>1</SB>. The waiting time includes the time until HDD8<SB>1</SB>becomes command-receivable, the time to end transfer of data, or the time until it can receive the next command. During this waiting time, the testing device 1 issues a command, for example, when HDD8<SB>2</SB>is command-receivable, and transfers data when data transfer can be performed. COPYRIGHT: (C)2007,JPO&INPIT
|
