发明名称 CHEMOMECHANICAL POLISHING METHOD OF SIC SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a highly efficient polishing method for obtaining a predetermined flatness by a chemomechanical polishing method in which an SiC substrate is polished using colloidal silica as abrasive grain. <P>SOLUTION: The chemomechanical polishing method uses colloidal silica as abrasive grain, drops an abrasive agent to a rotating polishing pad, and polishes the SiC substrate by depressing the SiC substrate under polish to the polishing pad with a predetermined pressure. The polishing is carried out using a mixed polishing agent of colloidal silica grain having a first abrasive grain distribution and a disperse catalyst containing pH adjuster, subsequently, the polishing is carried out using the mixed polishing agent of colloidal silica grain having a second abrasive grain distribution sharper than the first abrasive grain distribution and a disperse catalyst containing pH adjuster. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007067166(A) 申请公布日期 2007.03.15
申请号 JP20050251168 申请日期 2005.08.31
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUDA TAKAMASA;TAKAUO TSUTOMU;TANIMOTO EIJI
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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