发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY ELEMENT AND NONVOLATILE SEMICONDUCTOR MEMORY DEVICE USING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory element which occupies a small area and allows rewriting of data many times and has a superior data retention property. <P>SOLUTION: The nonvolatile semiconductor memory element which stores data by holding electric charge in a floating gate 18 includes a MOS transistor 13 having the floating gate 18, and a capacitor C consisting of a metal layer with one end of the capacitor C connected to the floating gate 18. In the nonvolatile semiconductor memory element of this structure by applying positive high voltage to a control gate 17, a writing operation is conducted in the MOS transistor 13 by FN tunneling; and by applying negative high voltage to the control gate 17, an erasing operation is conducted in the MOS transistor 13 by FN tunneling. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
申请公布号 |
JP2007066984(A) |
申请公布日期 |
2007.03.15 |
申请号 |
JP20050247878 |
申请日期 |
2005.08.29 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
YAMAMOTO YASUE;AGATA MASASHI;SHIRAHAMA MASANORI;KAWASAKI TOSHIAKI;NISHIHARA RYUJI;SUMI SHINICHI |
分类号 |
H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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