| 摘要 |
PROBLEM TO BE SOLVED: To properly determine quality by exposing a defective part easily causing leak, in an organic EL element where the thickness of a negative electrode capable of preventing it from being opened and broken in an aging process is not smaller than 135 nm. SOLUTION: In this manufacturing method of an organic EL element, a positive electrode 20 and an organic film 30 are formed on a substrate 10; the negative electrode 40 is formed on top of them at a thickness not smaller than 135 nm; a defective part exposing process is executed by applying a first voltage V1 as a reverse voltage between both the electrodes 20 and 40 and thereafter a second voltage V2 is applied as a reverse voltage between both the electrodes 20 and 40 to measure a leak current flowing then; and the quality of the organic EL element 100 is determined, based on the measured leak current. The measurement of the leak current is executed within a period in which the leak current of a defective product is set larger than the leak current of a normal product when the second voltage V2 is applied. COPYRIGHT: (C)2007,JPO&INPIT
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