发明名称 Methods of forming patterns and capacitors for semiconductor devices using the same
摘要 A semiconductor structure may be formed by a wet etching process using an etchant containing water. The semiconductor structure may include a plurality of patterns having an increased or higher aspect ratio and may be arranged closer to one another. A dry cleaning process may be performed using hydrogen fluoride gas on the semiconductor structure.
申请公布号 US2007059941(A1) 申请公布日期 2007.03.15
申请号 US20060455815 申请日期 2006.06.20
申请人 PARK CHEOL-WOO;YOON BYOUNG-MOON;KO YONG-SUN;KIM KYUNG-HYUN;LEE KWANG-WOOK 发明人 PARK CHEOL-WOO;YOON BYOUNG-MOON;KO YONG-SUN;KIM KYUNG-HYUN;LEE KWANG-WOOK
分类号 H01L21/302 主分类号 H01L21/302
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