发明名称 Sampling apparatus and test apparatus
摘要 There is provided a sampling apparatus including a pulse generating circuit and a sampling circuit. The pulse generating circuit includes a step recovery diode and anode side and cathode side input terminals of the diode, and the sampling circuit includes a measured signal wire that inputs the measured signal, anode side and cathode side first wires of the step recovery diode that propagate the pulse signal generated from the pulse generating circuit, and a sampling section that includes a first diode for sampling, of which an anode is connected to the cathode side first wire side and a cathode is connected to the measured signal wire, and a second diode for sampling, of which an anode is connected to the measured signal wire and a cathode is connected to the anode side first wire side, in which the step recovery diode is formed on a semiconductor layer different from that on which the diodes for sampling are formed.
申请公布号 US2007057661(A1) 申请公布日期 2007.03.15
申请号 US20060517187 申请日期 2006.09.07
申请人 ADVANTEST CORPORATION 发明人 SATO NOBUYA;KONNO TAKESHI;SHIWA SATOSHI;MIYAMOTO HIROSHI
分类号 G01R13/14 主分类号 G01R13/14
代理机构 代理人
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