| 摘要 |
<p>The circuit measures the current in an inductance (12) which is connected between two points (A & B). Measurement of the voltage (Vmes) provides an image of the current, I, in the inductance (12) and is effected between the specific points in a resistance circuit provided with a constant DC voltage supply. The circuit measures the current in an inductance (12) which is connected between two points (A & B). The circuit (10) includes a first resistance (R2) in series with a further resistance (R1) which is itself in parallel with a capacitance (C1). This assembly is connected in parallel with the inductance under test. A voltage shift circuit (16) includes a direct voltage generator (E) connected in parallel with a shift resistance (Roffset), in series with two parallel resistors (R3 & R4), the positive terminal of this source being connected to one of the inductance terminals (B). A temperature compensation circuit (20) is provided. Measurement of the voltage (Vmes) which images the current, I, in the inductance (12) is effected between the common point of the resistors (R1, R2) and the common point between the shift resistance (Roffset) and the two parallel resistors (R3, R4).</p> |
