A sectional memory module mounting tester is provided to improve test reliability by controlling target temperature of a memory module correspondently to a target value and to prevent the loss or breakage of peripheral devices installed on a mother board by forming a test environment only on the memory module. A sectional memory module mounting tester(100) for testing a memory module(10) on a mother board(13) equipped with plural memory modules and peripheral devices is composed of: a test table(50) where the mother board is installed; a hood(20) positioned at the upper side of the memory module of the mother board to surround the periphery of the memory module and sectionally form a test environment on the memory module; a transfer unit(30) combined to the upper part of the hood to move the hood; and a control unit for controlling the test environment and the transfer unit.
申请公布号
KR20070029994(A)
申请公布日期
2007.03.15
申请号
KR20050084708
申请日期
2005.09.12
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
YUN, SANG HAN;LEE, CHANG HO;PARK, BYEONG HO;LEE, BAE KI