发明名称 |
ONE-TO-ONE X-RAY EXPOSURE METHOD AND ONE-TO-ONE X-RAY EXPOSURE APPARATUS |
摘要 |
<p>A one-to-one mask (12) on which a plurality of identical patterns (11) are so formed as to be vertically aligned is used to apply X-rays (10) to one of the patterns on the one-to-one mask. The X-rays passing through the pattern on the one-to-one mask (12) are applied to a wafer (15) secured to a wafer stage (14) to perform a pattern exposure. The one-to-one mask (12) is secured to a mask stage (13) capable of horizontal reciprocating motion within the wafer stage (14) capable of vertical reciprocating motion within a vertical stage (16). In order to perform the pattern exposure of the entire surface of the wafer (15), while the X-rays (10) are being applied to the top of the patterns (11) on the one-to-one mask (12), both the one-to-one mask (12) and the wafer (15) are moved upward by the vertical stage (16). By this way, the X-rays (10) are applied to all of the vertically aligned patterns (11), and the pattern exposure is consequently performed on one vertical column in the wafer (15).</p> |
申请公布号 |
WO2007029303(A1) |
申请公布日期 |
2007.03.15 |
申请号 |
WO2005JP16228 |
申请日期 |
2005.09.05 |
申请人 |
OHMI, TADAHIRO;SUGAWA, SHIGETOSHI;YANAGIDA, KIMIO;TAKEHISA, KIWAMU |
发明人 |
OHMI, TADAHIRO;SUGAWA, SHIGETOSHI;YANAGIDA, KIMIO;TAKEHISA, KIWAMU |
分类号 |
H01L21/027;G03F1/16;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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