发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, AND METHOD OF INSPECTING SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To solve the problem wherein determination of whether operation of a latch circuit for latching each bit of parallel data is normal or not is complicated, in a semiconductor integrated circuit for converting serial data into parallel data to output the data. SOLUTION: An AND circuit 8 is connected to each inversion data output terminal of a plurality of DFFs 6-1 to 6-8. In this case, an inverter 10 is inserted between the circuit 8 and DFF 6 whose initial bit value is "1". When an output from the data output terminal of each DFF 6 is an initial bit value, the AND circuit 8 outputs an output value "1" of one bit. The integrated circuit 2 outputs an output of one bit of the AND circuit 8 to an external circuit of a microcomputer or the like, and the microcomputer or the like can determine whether each DFF 6 functions normally or not based on the value of one bit. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007064677(A) 申请公布日期 2007.03.15
申请号 JP20050248032 申请日期 2005.08.29
申请人 SANYO ELECTRIC CO LTD 发明人 SHIBANO SHINICHIRO
分类号 G01R31/28 主分类号 G01R31/28
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