发明名称 |
METHOD FOR FABRICATION OF IMAGE SENSOR FOR PREVENTING GENERATION OF DARK CURRENT |
摘要 |
A method for manufacturing an image sensor is provided to restrain the generation of a dark current by using an improved channel stop region with a boron concentration. A trench is formed on a substrate(200). A boron doped oxide layer is formed along an inner surface of the trench. A boron ion implantation process is performed on a bottom portion of the trench. A planarized field oxide layer(206) is filled in the trench. A photodiode is formed adjacent to the field oxide layer in the substrate. The thickness of the oxide layer is in a range of 300 to 1000 angstroms. The oxide layer is formed in a temperature range of 400 to 500 deg.C. The dose of the boron ion implantation is in a temperature range of 1.0E12 to 5.0E13 atoms/cm^2.
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申请公布号 |
KR20070029369(A) |
申请公布日期 |
2007.03.14 |
申请号 |
KR20050084084 |
申请日期 |
2005.09.09 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
SA, SEUNG HOON |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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