发明名称 |
APPARATUS FOR CLEANING PAD AND DISPERSING SLURRY IN CHEMICAL MECHANICAL POLISHING EQUIPMENT |
摘要 |
An apparatus for cleaning a pad and dispersing slurry in CMP equipment is provided to prevent the generation of micro scratches on a wafer and to extend the lifetime of the slurry using an ultrasonic generating unit. An apparatus for cleaning a pad and dispersing slurry in CMP equipment includes a polishing table(31), a polishing pad(32) attached on the polishing table, a supply unit, and an ultrasonic generating unit. The supply unit(35) is installed at an end portion of a supply line to supply the slurry and deionized water to an upper portion of the polishing table. The ultrasonic generating unit(36) is installed at the supply unit to prevent the agglomeration of slurry grains and re-dispersing the slurry.
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申请公布号 |
KR20070029418(A) |
申请公布日期 |
2007.03.14 |
申请号 |
KR20050084188 |
申请日期 |
2005.09.09 |
申请人 |
SILTRON INC. |
发明人 |
BAECK, KYOUNG LOCK;LEE, GUN HO;CHOI, EUN SUCK;BAE, SO IK |
分类号 |
H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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