发明名称 |
Impact test apparatus and impact test method |
摘要 |
<p>An impact test apparatus includes a holding device (3) for holding a test piece (2) at an arbitrary holding force, an impact applying device (4) for applying an impact force to the test piece (2) held by the holding device (3), a force sensor (5) for sensing the impact force applied to the test piece (2) by the impact applying device (4), a high-speed camera (6) for detecting a displacement of the test piece (2) when applied with the impact force by the impact applying device (4), and an output device (7) for synchronizing a signal from the force sensor (5) with a signal from the high-speed camera (6) and outputting an impact stress-strain characteristic curve when the impact force is applied to the test piece (2).</p> |
申请公布号 |
EP1762836(A1) |
申请公布日期 |
2007.03.14 |
申请号 |
EP20060026322 |
申请日期 |
2005.06.15 |
申请人 |
NITTO DENKO CORPORATION |
发明人 |
HATANAKA, TAKEZOU;SUGIHARA, YASUNORI;YOSHIDA, JUNJI;AZUMI, YUKIKO;KAGEHISA, YUUKI |
分类号 |
G01N3/30;G01N3/00 |
主分类号 |
G01N3/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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