发明名称 Impact test apparatus and impact test method
摘要 <p>An impact test apparatus includes a holding device (3) for holding a test piece (2) at an arbitrary holding force, an impact applying device (4) for applying an impact force to the test piece (2) held by the holding device (3), a force sensor (5) for sensing the impact force applied to the test piece (2) by the impact applying device (4), a high-speed camera (6) for detecting a displacement of the test piece (2) when applied with the impact force by the impact applying device (4), and an output device (7) for synchronizing a signal from the force sensor (5) with a signal from the high-speed camera (6) and outputting an impact stress-strain characteristic curve when the impact force is applied to the test piece (2).</p>
申请公布号 EP1762836(A1) 申请公布日期 2007.03.14
申请号 EP20060026322 申请日期 2005.06.15
申请人 NITTO DENKO CORPORATION 发明人 HATANAKA, TAKEZOU;SUGIHARA, YASUNORI;YOSHIDA, JUNJI;AZUMI, YUKIKO;KAGEHISA, YUUKI
分类号 G01N3/30;G01N3/00 主分类号 G01N3/30
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