发明名称 |
PROBE, ITS MANUFACTURING METHOD, CONTACT DEVICE USING PROBE, AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To prevent wear of a probe 6 of a type where the metal probe 6 defining a contactor is arranged on a wiring film 10 on a wiring substrate 4 from reducing electrical connection with an electrode of a measured electronic device or the like. SOLUTION: The probe 6 coming into contact with the electrode of the measured body is formed of a laminated metal structure in which second metal films 32 and 32 made of a precious metal such as gold are formed on both sides of a first metal film 30. The plane pattern (shape) has at least a base 34 defining an end on the side of the wiring substrate and a ring-like elastic section 36. The probe 6 is connected onto a probe connection region 12 of the wiring film 10 of the wiring substrate 4 at the base 34 via a metal film (for example, tin or solder) 24 for connecting the probe. COPYRIGHT: (C)2007,JPO&INPIT
|
申请公布号 |
JP2007057445(A) |
申请公布日期 |
2007.03.08 |
申请号 |
JP20050245100 |
申请日期 |
2005.08.26 |
申请人 |
FUCHIGAMI MICRO:KK |
发明人 |
UEDA TORU;OSAWA KENJI;MARUNO YOSHIYUKI |
分类号 |
G01R1/067;G01R1/073 |
主分类号 |
G01R1/067 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|