发明名称 Scintillation measuring method of display device and scintillation measuring device
摘要 A measuring method of scintillation appearing on a display image of a display device installed with a light source including: capturing the display image from a plurality of capturing positions respectively having different capturing angles relative to the display image to obtain a plurality of captured images; and acquiring scintillation by comparing pixels of the captured images each corresponding to a common pixel of the display image and acquiring data of pixels having different luminance as scintillation information.
申请公布号 US2007052800(A1) 申请公布日期 2007.03.08
申请号 US20060516185 申请日期 2006.09.06
申请人 SEIKO EPSON CORPORATION 发明人 YAMAGISHI EIICHI
分类号 H04N7/18 主分类号 H04N7/18
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