| 摘要 |
PROBLEM TO BE SOLVED: To provide a new semiconductor device having a test interface apparatus, and to provide a new method for operating the semiconductor device. SOLUTION: In a test mode, a working clock signal is synchronized with a test bed and introduced into the semiconductor device (1) through a first pin (2), and test data is introduced through at least one second pin (3). From the first viewpoint, the working clock signal is also used as a test data clock signal so as to reduce the number of the pins (2, 3). From the second viewpoint, two pins (2, 3) of the semiconductor device are provided as oscillator pins for connecting a crystal oscillator (4) for generating the clock signal in a normal operation mode. The test data is introduced into the semiconductor device (1) through one oscillator pin in the test operation mode. COPYRIGHT: (C)2007,JPO&INPIT
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