发明名称 PATTERN CORRECTION DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a pattern correction device with a long continuous use time. <P>SOLUTION: With this pattern correction device, an atomized gas flow is set at a given level lower than the lowest sprayable limit at a time when deposition of correction liquid is finished at a defective part, and stops generation of fog particles P of the correction liquid 20 in the deposition device 5 and at the same time, blasts the fog particles P of the correction liquid in the deposition device 5. Therefore, clogging of the device is prevented to extend a continuous use time of the device. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007059089(A) 申请公布日期 2007.03.08
申请号 JP20050240050 申请日期 2005.08.22
申请人 NTN CORP 发明人 KOIKE TAKASHI;SHIMIZU SHIGEO
分类号 H01J9/50;H01J11/02;H01J11/20;H01J11/22;H01J11/34 主分类号 H01J9/50
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