发明名称 NITRIDE SEMICONDUCTOR ELEMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor element having high avalanche withstand capability and low on-resistance properties. <P>SOLUTION: The nitride semiconductor element comprises a laminate, having a first semiconductor layer made of a nitride semiconductor and a second semiconductor layer that is provided on the first one, and is made of a non-doped or n-type nitride semiconductor having a larger band gap than that of the first semiconductor layer; a control electrode provided at a first region on the main surface of the laminate directly or via an insulating film; first and second main electrodes provided at second and third regions, respectively, adjacent to both the ends of the first region on the main surface of the laminate; and a third main electrode provided at a side opposite to the control electrode while sandwiching the second main electrode on the main surface of the laminate. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007059589(A) 申请公布日期 2007.03.08
申请号 JP20050242534 申请日期 2005.08.24
申请人 TOSHIBA CORP 发明人 SAITO WATARU;ONOMURA MASAAKI
分类号 H01L21/338;H01L27/095;H01L29/06;H01L29/778;H01L29/78;H01L29/786;H01L29/812 主分类号 H01L21/338
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