发明名称 DEGRADATION ESTIMATION SYSTEM FOR ELECTRICITY ACCUMULATION DEVICE
摘要 PROBLEM TO BE SOLVED: To precisely grasp a degradation of electricity accumulation device for a long time without being affected by environmental temperature or fluctuation of a load. SOLUTION: In the case, the amount of the fluctuation per unit time is lower than the reference value, the increment of internal resistance of a battery is calculated, and the increment of the internal resistance is subjected to the averaging procedure (S4); in the case, the number of times of the averaging procedures reaches to the prescribed times, the degradation degree SOH1 is calculated by using the averaged increment of the internal resistance (S6); the calculation for degree of degradation SOH2 is started by the Arrhenius equation wherein, the degree of degradation SOH1 is used as an initial value; the present degradation speed Ka is calculated (S9), if the conditions that the data of the terminal voltage V, current I, temperature T are inputted, and the ECU power source is ON are satisfied; and the present degree of degradation SOH2 is calculated (S10) by the integration of the Arrhenius equation. Thereby, the degradation of the electricity accumulation device can be precisely grasped for the long time without being affected by the environmental temperature or the fluctuation of the load. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007057385(A) 申请公布日期 2007.03.08
申请号 JP20050243319 申请日期 2005.08.24
申请人 FUJI HEAVY IND LTD 发明人 ONO MIKIO;NANBA ATSUSHI
分类号 G01R31/36;B60R16/04;H01M10/48 主分类号 G01R31/36
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