| 摘要 |
In one set of embodiments, a temperature measurement system may include an analog to digital converter (ADC) to produce digital temperature readings according to a difference base-emitter voltage (DeltaV<SUB>BE</SUB>) developed across a PN-junction. A clock generating circuit may be configured to provide a sampling clock used by the ADC, which in some embodiments may be a delta-sigma ADC, in performing the conversions. The clock generating circuit may be configured to change the frequency of the sampling clock a specified number of times within each one of the one or more conversion cycles to reduce an error component in the temperature measurement, where the error component is produced by an interfering signal, such as an electromagnetic interference (EMI) signal being coherent with the sampling clock, and/or a noise residing on the voltage supply and also being coherent with the sampling clock.
|
