发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device having a semiconductor film having small unevenness on the surface. SOLUTION: The manufacturing method of the semiconductor device includes a process for arranging a semiconductor film 13 on the surface of a base film, a protective film arrangement process for arranging a protective film 14 on the surface of the semiconductor film 13, and a process for melting a part of the semiconductor film 13 in a thickness direction by irradiating a laser beam locally from the upper part of the protective film 14. Furthermore, the method includes a crystallization process for forming a crystal which has the longitudinal direction almost parallel to the surface of the semiconductor film 13 by cooling a part of the molten semiconductor film 13; and a flattening process for making the semiconductor film 13 flat in a state that the protective film 14 is arranged on the surface of the semiconductor film 13. The crystallization process includes a process wherein the emerging projection 17 of the semiconductor film 13 runs through the protective film 14. The flattening process includes a process for removing at least a part of the projection 17. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007059601(A) 申请公布日期 2007.03.08
申请号 JP20050242710 申请日期 2005.08.24
申请人 SHARP CORP 发明人 KASHIWAGI IKUMI;SEKI MASANORI;NAKAYAMA JUNICHIRO
分类号 H01L21/20;H01L21/336;H01L29/786 主分类号 H01L21/20
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