发明名称 |
TFT array substrate for inspection and method for inspection using the same |
摘要 |
A TFT substrate for inspection for shorts, includes a substrate defined by a display area and a non-display area outside the display area; a plurality of first and second lines formed in the display area on the substrate; pad lines formed to be extended from one side of each of the first lines to the non-display area; a plurality of signal inspection bars formed in the non-display area to cross the pad lines at one side of the pad lines; a shorting inspection bar spaced apart from the outermost signal inspection bar at a predetermined interval and substantially parallel with the signal inspection bar and connected to the pad lines; and a plurality of transparent electrode patterns partially overlapped with the pad lines and connected to one of the signal inspection bars.
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申请公布号 |
US2007052896(A1) |
申请公布日期 |
2007.03.08 |
申请号 |
US20060449783 |
申请日期 |
2006.06.09 |
申请人 |
EOM SOUNG Y;KANG DONG W;KIM BONG C;YANG KI S |
发明人 |
EOM SOUNG Y.;KANG DONG W.;KIM BONG C.;YANG KI S. |
分类号 |
G02F1/1343 |
主分类号 |
G02F1/1343 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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