发明名称 PHASE CHANGE RANDOM ACCESS MEMORY AND METHOD OF OPERATING THE SAME
摘要 <p>A PRAM(phase change random access memory) is provided to reduce the size of a transistor by lowering the reset current of a PRAM. A PRAM includes a switching device and a storage node connected to the switching device. The storage node includes a first electrode, a phase change layer, a heat generating high-efficient unit and a second electrode. The heat generating high-efficient unit is one of a CNT(carbon nano tube) layer, a nano particle layer or a nano dot layer. The heat generating high-efficient unit includes at least two sequentially stacked layers.</p>
申请公布号 KR100695162(B1) 申请公布日期 2007.03.08
申请号 KR20050085250 申请日期 2005.09.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG MOCK;KHANG, YOON HO;NOH, JIN SEO;SUH, DONG SEOK
分类号 H01L27/115 主分类号 H01L27/115
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