| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that it is difficult to adapt a conventional technique for providing a small-sized device which monitors the development and occurrence of a flaw using a potential difference method in case a measuring target is provided in a narrow part or covered with a cover material because a means for connecting a terminal for measuring potential difference or a terminal for supplying a current to the measuring target is complicated. SOLUTION: This technique can be adapted even in case the measuring target is provided in the narrow part or covered with the cover material by printing a potential measuring terminal and a current supplying terminal on a film-like substrate and can be also adapted even in case the measuring target is exposed to high temperature by using a heat-resistant plastic polymer material as a film. The structure of the flaw monitoring device is sharply miniaturized by monitoring the development and occurrence of the flaw and printing the potential measuring terminal and the current supplying terminal on the film-like substrate and an adaptation target part is expanded. COPYRIGHT: (C)2007,JPO&INPIT
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