发明名称 METHODS OF ETCHING NICKEL SILICIDE AND COBALT SILICIDE AND METHODS OF FORMING CONDUCTIVE LINES
摘要 The invention includes methods of etching nickel suicide and cobalt suicide, and methods of forming conductive lines. In one implementation, a substrate comprising nickel suicide is exposed to a fluid comprising H<SUB>3</SUB>PO<SUB>4</SUB> and H<SUB>2</SUB>O at a temperature of at least 50°C and at a pressure from 350 Torr to 1100 Torr effective to etch nickel suicide from the substrate. In one implementation, at least one of nickel suicide or cobalt suicide is exposed to a fluid comprising H<SUB>2</SUB>SO<SUB>4</SUB>, H<SUB>2</SUB>O<SUB>2</SUB>, H<SUB>2</SUB>O, and HF at a temperature of at least 50 °C and at a pressure from 350 Torr to 1100 Torr effective to etch the at least one of nickel suicide or cobalt suicide from the substrate.
申请公布号 WO2006132789(A3) 申请公布日期 2007.03.08
申请号 WO2006US19693 申请日期 2006.05.19
申请人 MICRON TECHNOLOGY, INC. 发明人 RAGHU, PRASHANT
分类号 H01L21/3213 主分类号 H01L21/3213
代理机构 代理人
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